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Use of fcc Metals as Internal Temperature Standards in X‐Ray Diffraction

 

作者: R. O. Simmons,  

 

期刊: Journal of Applied Physics  (AIP Available online 1970)
卷期: Volume 41, issue 5  

页码: 2235-2240

 

ISSN:0021-8979

 

年代: 1970

 

DOI:10.1063/1.1659193

 

出版商: AIP

 

数据来源: AIP

 

摘要:

A clear pattern of systematic error is found in thermal expansion values for Al, Ag, and Au commonly recommended and used as internal references for temperature determination in x‐ray diffraction. Evidence comes from a critical analysis of the literature, including several studies of temperature measurement errors in powder cameras, and from new calibration of a thermometer used previously in precise lattice and length expansion studies. Necessary changes in the commonly accepted values for expansion of Pt and MgO are implied.

 

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