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Comment on ‘‘Steady‐state temperature profile for a thin‐film resistor under bias’’ [J. Appl. Phys.72, 3862 (1992)]

 

作者: Yong‐Feng Lu,  

 

期刊: Journal of Applied Physics  (AIP Available online 1993)
卷期: Volume 74, issue 8  

页码: 5290-5290

 

ISSN:0021-8979

 

年代: 1993

 

DOI:10.1063/1.355308

 

出版商: AIP

 

数据来源: AIP

 

摘要:

This comment is to point out that the temperature dependence of the thermal conductivity should be taken into account in computing the temperature distribution in substrate material (such as silicon) with temperature‐dependent thermal conductivity. Ignoring the temperature dependence of the thermal conductivity will lead to a large error in the calculated results.

 

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