Cryostat forin situscanning tunneling microscopy studies of film growth at low temperatures
作者:
K. L. Ekinci,
J. M. Valles,
期刊:
Review of Scientific Instruments
(AIP Available online 1997)
卷期:
Volume 68,
issue 11
页码: 4152-4154
ISSN:0034-6748
年代: 1997
DOI:10.1063/1.1148360
出版商: AIP
数据来源: AIP
摘要:
This article describes a low temperature scanning tunneling microscope (STM) system which is designed to study film growth at very low substrate temperatures(4 K<TS<77 K).A simple tripod design with the addition of a sample manipulator, is implemented as the STM head. In this system, a metal film can be thermally deposited on a conducting or an insulating substrate held at cryogenic temperatures and be probedin situby STM.In situand room temperature images of a Pb film grown on a 4 K substrate are presented. ©1997 American Institute of Physics.
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