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Selective deposition of metals on submicron resist patterns

 

作者: J. Petermann,   T. Hoffmann,   J. Martinez‐Salazar,  

 

期刊: Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena  (AIP Available online 1994)
卷期: Volume 12, issue 2  

页码: 613-615

 

ISSN:1071-1023

 

年代: 1994

 

DOI:10.1116/1.587398

 

出版商: American Vacuum Society

 

关键词: LITHOGRAPHY;PHOTORESISTS;TELLURIUM;DEPOSITION;ELECTRON BEAMS;PARAFFIN;TIN;SURFACE CONTAMINATION;CARBONIZATION;CARBON;Te;paraffin;resists;C;Sn

 

数据来源: AIP

 

摘要:

A process to coat submicron structures in paraffin resists, selectively with metals in a single vacuum cycle (all‐dry process), is demonstrated. The process includes the evaporation of paraffin on to a support, the generating of crosslinked areas by irradiation with electrons, the developing of the structure by heating the resist film, and finally a selective coating with metal. The degree of crosslinking of the paraffin film has a remarkably influence on the nucleation density of the metal and allows us to control on a very fine scale the area on which the metal is deposited.

 

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