Selective deposition of metals on submicron resist patterns
作者:
J. Petermann,
T. Hoffmann,
J. Martinez‐Salazar,
期刊:
Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena
(AIP Available online 1994)
卷期:
Volume 12,
issue 2
页码: 613-615
ISSN:1071-1023
年代: 1994
DOI:10.1116/1.587398
出版商: American Vacuum Society
关键词: LITHOGRAPHY;PHOTORESISTS;TELLURIUM;DEPOSITION;ELECTRON BEAMS;PARAFFIN;TIN;SURFACE CONTAMINATION;CARBONIZATION;CARBON;Te;paraffin;resists;C;Sn
数据来源: AIP
摘要:
A process to coat submicron structures in paraffin resists, selectively with metals in a single vacuum cycle (all‐dry process), is demonstrated. The process includes the evaporation of paraffin on to a support, the generating of crosslinked areas by irradiation with electrons, the developing of the structure by heating the resist film, and finally a selective coating with metal. The degree of crosslinking of the paraffin film has a remarkably influence on the nucleation density of the metal and allows us to control on a very fine scale the area on which the metal is deposited.
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