X‐Ray Measurements of Particle Size and Strain Distribution in Cold Worked Silver
作者:
F. R. L. Schoening,
J. N. Van Niekerk,
期刊:
Journal of Applied Physics
(AIP Available online 1955)
卷期:
Volume 26,
issue 6
页码: 726-728
ISSN:0021-8979
年代: 1955
DOI:10.1063/1.1722079
出版商: AIP
数据来源: AIP
摘要:
X‐ray diffraction profiles from filed solid silver specimens were measured with a Geiger counter spectrometer using crystal‐reflected Cu K&agr; radiation. It is shown that for values ofn>7, the assumption of a Gauss strain distribution fits the observed Fourier coefficients far better than a Cauchy distribution. The results obtained from solid specimens are consistent with those previously measured for silver filings. The influence of background errors is discussed.
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