Strontium and Silicon Simultaneous Diffusion in Single‐Crystal MgO
作者:
Isao Sakaguchi,
Hisayoshi Yurimoto,
Shigeho Sueno,
期刊:
Journal of the American Ceramic Society
(WILEY Available online 1992)
卷期:
Volume 75,
issue 12
页码: 3477-3480
ISSN:0002-7820
年代: 1992
DOI:10.1111/j.1151-2916.1992.tb04454.x
出版商: Blackwell Publishing Ltd
数据来源: WILEY
摘要:
Diffusion profiles of Sr in single‐crystal MgO at 1473 to 1843 K have been determined by a depth‐profiling technique using secondary ion mass spectrometry. The diffusion experiments were performed using a focusing infrared furnace. The temperature dependences of lattice and dislocation diffusion areD1= 2.6 × 10−11exp(–268.2/RT[kJ/mol])[m2.s‐1],Dd= 1.7 × 104exp(–562.3/RT), respectively. The present lattice diffusion coefficients are three orders of magnitude smaller than those previously reported. Si diffused with Sr in MgO over 1583 K, and the diffusion coefficients of Si were also determined. The results of Si diffusion were equivalent to those of our p
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