Influence of high‐dose &ggr; irradiation on electron mobility in a silicon inversion layer
作者:
B. Majkusiak,
A. Jakubowski,
K. Grigorov,
A. Balasin´ski,
期刊:
Applied Physics Letters
(AIP Available online 1990)
卷期:
Volume 57,
issue 16
页码: 1643-1644
ISSN:0003-6951
年代: 1990
DOI:10.1063/1.104074
出版商: AIP
数据来源: AIP
摘要:
An influence of high‐dose &ggr; irradiation on the dependence of electron mobility on transverse electric field in the silicon surface inversion layer is experimentally determined and considered.
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