Characterization of electron beam induced modification of thermally grown SiO2
作者:
J. R. Barnes,
A. C. F. Hoole,
M. P. Murrell,
M. E. Welland,
A. N. Broers,
J. P. Bourgoin,
H. Biebuyck,
M. B. Johnson,
B. Michel,
期刊:
Applied Physics Letters
(AIP Available online 1995)
卷期:
Volume 67,
issue 11
页码: 1538-1540
ISSN:0003-6951
年代: 1995
DOI:10.1063/1.114485
出版商: AIP
数据来源: AIP
摘要:
We used local probe techniques to characterize electron beam (e‐beam) induced changes in thin oxides on silicon. Primary effects of the 1 nm wide, 300 keV e beam included the formation of positive charges trapped in the SiO2, physical restructuring in the oxide, and deposition of carbonaceous compounds. Charges remained stable in thicker oxides (460 nm) and appeared as changes in the contact potential or microwave response with widths down to 100 nm. In thinner oxides (20 nm) the amount of charge was smaller and less stable; below 7 nm no charge was detected. Physical changes in the oxide, evident as a swelling of irradiated areas, accounted for the etching selectivity of these regions. ©1995 American Institute of Physics.
点击下载:
PDF
(234KB)
返 回