Resonance Raman scattering from epitaxial InSb films grown by metalorganic magnetron sputtering
作者:
Z. C. Feng,
S. Perkowitz,
T. S. Rao,
J. B. Webb,
期刊:
Journal of Applied Physics
(AIP Available online 1990)
卷期:
Volume 68,
issue 10
页码: 5363-5365
ISSN:0021-8979
年代: 1990
DOI:10.1063/1.347033
出版商: AIP
数据来源: AIP
摘要:
We have examined epitaxial InSb films by Raman scattering for the first time. The films, 0.17–2.67 &mgr;m thick, were grown on (100) GaAs substrates by the new technique of metalorganic magnetron sputtering. We observe the first and second order longitudinal optical phonon peaks, the latter enhanced by outgoing resonance with theE1+&Dgr;1gap of InSb, and an upshift of this gap due to compressive biaxial stress. We also observe an anomalous dependence of stress on film thickness. The Raman data indicate good sample quality despite the large lattice mismatch between InSb and GaAs.
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