Bragg reflectors based on (Ca,Sr)F2and (Ga,Al)As are studied. Modeling and fabrication of these structures by molecular‐beam epitaxy were performed. Quarter‐wave Bragg reflectors were found to present an excellent reflectance around the wavelength of interest, 870 nm, for only three periods of bilayers. However, the structures grown exhibited cracks after epitaxy due to thermal stress between both materials. To alleviate this problem, other reflector geometries were investigated consisting of deviations from the classical Bragg reflector. The new geometries enable one to reduce the absolute or relative fluoride thickness within the structure. The results obtained show that the use of adequate geometries allows one to overcome the stress problem, and good heteroepitaxial reflectors with a crack‐free surface morphology were obtained.