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Benign making of sharp tips for STM and FIM: Pt, Ir, Au, Pd, and Rh

 

作者: A. J. Nam,   A. Teren,   T. A. Lusby,   A. J. Melmed,  

 

期刊: Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena  （AIP Available online 1995）
卷期: Volume 13, issue 4  

页码: 1556-1559

 

ISSN:1071-1023

 

年代: 1995

 

DOI:10.1116/1.588186

 

出版商: American Vacuum Society

 

关键词: MICROSCOPES;PROBES;PLATINUM;IRIDIUM;GOLD;PALLADIUM;RHODIUM;ELECTROPOLISHING;VOLTAGE DEPENDENCE;TIME DEPENDENCE;COMPARATIVE EVALUATIONS

 

数据来源: AIP

 

摘要:

Sharp tips for various modern microscopies, such as field‐ion microscopy (FIM) and scanning tunneling microscopy (STM), can be prepared by electropolishing in solutions which are relatively innocuous for the environment as well as the researcher, compared to the often hazardous solutions still in widespread use. We have made measurements of polishing times as a function of solution and voltage parameters and we report conditions for electropolishing sharp tips of Pt, Ir, Au, Pd, and Rh using relatively benign solutions.

 

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