Studies on the 1831 cm−1SiH band in NTD c-Si containing H
作者:
M.W. Qi,
T.S. Shi,
Y.G. Zhao,
P.X. Cai,
J.J. Gao,
期刊:
Radiation Effects and Defects in Solids
(Taylor Available online 1989)
卷期:
Volume 111-112,
issue 1-2
页码: 375-380
ISSN:1042-0150
年代: 1989
DOI:10.1080/10420158908213010
出版商: Taylor & Francis Group
数据来源: Taylor
摘要:
The dose dependence and annealing behavior of the 1831 cm−1SiH band in NTD c-Si containing H have been studied via FTIR. The annealing kinetics has been found to be of first order with the activation energy equal to 1.45+−0.1 eV. The possible models for this SiH band have been discussed.
点击下载:
PDF (205KB)
返 回