In situobservation of phase transition and the transition‐induced step bunching on InAs(001) surfaces by scanning electron microscopy
作者:
Hiroshi Yamaguchi,
Yoshikazu Homma,
Yoshiji Horikoshi,
期刊:
Applied Physics Letters
(AIP Available online 1995)
卷期:
Volume 66,
issue 13
页码: 1626-1628
ISSN:0003-6951
年代: 1995
DOI:10.1063/1.113873
出版商: AIP
数据来源: AIP
摘要:
The reconstruction and the step structure change during the phase transition on an InAs(001) surface under As pressure is observed directly by using scanning electron microscopy. The domain formation corresponding to the first‐order phase transition is clearly seen as predicted by Monte Carlo simulation with a lattice gas model. It is also seen that the step structure largely depends on the surface reconstruction and the misorientation direction. This gives the first observation of phase‐transition‐induced step bunching on a compound semiconductor surface. ©1995 American Institute of Physics.
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