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Determination of the nature of stacking-fault tetrahedra in electron-irradiated silver by high-resolution structural imaging

 

作者: W. Sigle,   M.L. Jenkins,   J.L. Hutchison,  

 

期刊: Philosophical Magazine Letters  （Taylor Available online 1988）
卷期: Volume 57, issue 5  

页码: 267-271

 

ISSN:0950-0839

 

年代: 1988

 

DOI:10.1080/09500838808203777

 

出版商: Taylor & Francis Group

 

数据来源: Taylor

 

摘要:

High-resolution structural imaging has been used to show that the great majority of stacking-fault tetrahedra produced in thin foils of electron-irradiated silver are of vacancy nature.

 

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