A series of thin CoCrPt layered structures has been studied with a view to understanding the nature and extent of any interactions present, both within and between the various constituent layers. In this investigation, we have utilized the principal remanence curves and their derivatives to characterize the bulk magnetic properties of the samples. In addition, we have employed a low energy broad beam Kaufman‐type ion source to sputter etch some of the layers, enabling unambiguous determination of the reversal fields of the various constituent layers. For each layered sample the magnetic layer grown on the thick Cr underlayer has the highest in‐plane coercivity. The second layer grown on a 100 A˚ Cr spacer has the next largest coercivity. All additional layers reverse at the same applied field strength. The coercivity of the layers is also insensitive to thickness reduction from 200 A˚downto80 A˚. ©1995 American Institute of Physics.