X‐ray reflectivity studies of SiO2/Si(001)
作者:
T. A. Rabedeau,
I. M. Tidswell,
P. S. Pershan,
J. Bevk,
B. S. Freer,
期刊:
Applied Physics Letters
(AIP Available online 1991)
卷期:
Volume 59,
issue 26
页码: 3422-3424
ISSN:0003-6951
年代: 1991
DOI:10.1063/1.105695
出版商: AIP
数据来源: AIP
摘要:
X‐ray reflectivity has been utilized in a study of the SiO2/Si interfacial structure for dry oxides grown at room temperature on highly ordered Si(001) surfaces. Scattering near (±110) demonstrates the Si lattice termination of the wafers studied is characterized by a highly ordered array of terraces separated by monoatomic steps. Specular reflectivity data indicate the ‘‘native’’ dry oxide thickness is approximately 5 A˚ with a 1‐A˚ vacuum interface width. Residual laminar order in the oxide electron density along the oxide/Si interfacial normal decays exponentially from the oxide/Si interface with a ∼2.7‐A˚ decay length.
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