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Reflection scanning near-field optical microscopy with uncoated fiber tips: How good is the resolution really?

 

作者: V. Sandoghdar,   S. Wegscheider,   G. Krausch,   J. Mlynek,  

 

期刊: Journal of Applied Physics  (AIP Available online 1997)
卷期: Volume 81, issue 6  

页码: 2499-2503

 

ISSN:0021-8979

 

年代: 1997

 

DOI:10.1063/1.363957

 

出版商: AIP

 

数据来源: AIP

 

摘要:

We have investigated the optical resolution of a scanning near-field optical microscope in reflection collection mode using an uncoated fiber tip. We demonstrate that the apparent resolution in the optical signal (better than 70 nm) is a topography-induced effect. We believe that the purely optical resolution is only of the order of &lgr;/2 and diffraction limited. ©1997 American Institute of Physics.

 

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