Reflection scanning near-field optical microscopy with uncoated fiber tips: How good is the resolution really?
作者:
V. Sandoghdar,
S. Wegscheider,
G. Krausch,
J. Mlynek,
期刊:
Journal of Applied Physics
(AIP Available online 1997)
卷期:
Volume 81,
issue 6
页码: 2499-2503
ISSN:0021-8979
年代: 1997
DOI:10.1063/1.363957
出版商: AIP
数据来源: AIP
摘要:
We have investigated the optical resolution of a scanning near-field optical microscope in reflection collection mode using an uncoated fiber tip. We demonstrate that the apparent resolution in the optical signal (better than 70 nm) is a topography-induced effect. We believe that the purely optical resolution is only of the order of &lgr;/2 and diffraction limited. ©1997 American Institute of Physics.
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