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Selected Area X‐Ray Diffraction Studies of Surface Damage in Sliding on Single‐Crystal Copper

 

作者: David D. Roshon,  

 

期刊: Journal of Applied Physics  (AIP Available online 1964)
卷期: Volume 35, issue 4  

页码: 1262-1269

 

ISSN:0021-8979

 

年代: 1964

 

DOI:10.1063/1.1713605

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Selected area x‐ray diffraction was employed to study the localized structural changes resulting from sliding of a hemispherical copper stylus on the (001) face of a copper single crystal. Although a relatively large (0.25 mm) x‐ray beam was used, significant structural deformations were resolved. Features observed included deformation of boundary regions by rotation from slip, crystal bending in areas of pileup, the micro‐crystalline Beilby layer, a preferentially oriented transition region, and transferred crystalline particles. The observed deformations exhibited a dependence on sliding direction.

 

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