Enhanced local surface conductivity measurements by scanning tunneling microscopy
作者:
F. Mu¨ller,
A.-D. Mu¨ller,
O. Meissner,
A. Heilmann,
M. Hietschold,
期刊:
Review of Scientific Instruments
(AIP Available online 1997)
卷期:
Volume 68,
issue 8
页码: 3104-3107
ISSN:0034-6748
年代: 1997
DOI:10.1063/1.1148250
出版商: AIP
数据来源: AIP
摘要:
A scanning tunneling microscope with a completely digital control is described which is able to determine in addition to the sample topography the local reactance of the surface by using a mathematical procedure. The new types of information allow a more detailed discussion of surface properties. The measurements were carried out at gold films on silicon wafers. On a plasma polymer gold composite surface typical reactance differences will be demonstrated. ©1997 American Institute of Physics.
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