Understanding the relative sensitivity of radiographic screens to scattered radiation
作者:
Kwok L. Yip,
Bruce R. Whiting,
Thomas E. Kocher,
David P. Trauernicht,
Richard L. Van Metter,
期刊:
Medical Physics
(WILEY Available online 1998)
卷期:
Volume 23,
issue 10
页码: 1727-1737
ISSN:0094-2405
年代: 1998
DOI:10.1118/1.597830
出版商: American Association of Physicists in Medicine
数据来源: WILEY
摘要:
This study compared the relative response of various screen‐film and computed radiography (CR) systems to diagnostic radiation exposure. An analytic model was developed to calculate the total energy deposition within the depth of screen and the readout signal generated from this energy for the x‐ray detection system. The model was used to predict the relative sensitivity of several screen‐film and CR systems to scattered radiation as a function of various parameters, such as x‐ray spectra, phantom thickness, phosphor composition, screen thickness, screen configuration (single front screen, single back screen, screen pair), and readout conditions. In addition, measurements of the scatter degradation factor (SDF) for different screen systems by using the beam stop technique with water phantoms were made to verify the model results. Theoretically calculated values of SDF were in good agreement with experimental data. These results are consistent with the common observation that rare‐earth screens generally produce better image quality than calcium tungstate screens and the CR screen.
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