首页   按字顺浏览 期刊浏览 卷期浏览 Determination of ice sublimation and sputtering yields by reflectance measurements
Determination of ice sublimation and sputtering yields by reflectance measurements

 

作者: F. Spinella,   G.A. Baratta,   G. Strazzulla,   L. Torrisi,  

 

期刊: Radiation Effects and Defects in Solids  （Taylor Available online 1991）
卷期: Volume 115, issue 4  

页码: 307-313

 

ISSN:1042-0150

 

年代: 1991

 

DOI:10.1080/10420159108220577

 

出版商: Taylor & Francis Group

 

数据来源: Taylor

 

摘要:

The thickness of ice (H2O) layers accreted on a cold finger has been measured by detecting the interference pattern of a He-Ne laser beam (632.8 nm) reflected from the ice surface and from the underlying substrate.

 

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