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Electrostatic accel–decel lens with the advantage of reduced chromatic aberration

 

作者: Setsuo Nomura,  

 

期刊: Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena  (AIP Available online 1998)
卷期: Volume 16, issue 1  

页码: 104-108

 

ISSN:1071-1023

 

年代: 1998

 

DOI:10.1116/1.589762

 

出版商: American Vacuum Society

 

数据来源: AIP

 

摘要:

An electrostatic lens, operated in accel–decel mode, is presented. The lens has advantage of low chromatic aberration, which is about2/3the amount produced by a conventional einzel lens operated in decel mode. The lens has two pieces of electrodes built in to accelerate and decelerate the beam. The decelerating electrode works as a main lens, while the accelerating electrode enhances the beam energy, reducing the aberration. Calculations for the accel–decel lens provideCcof 22 mm andfof 10 mm with working distance of 5 mm. The lens is suitable for producing a fine beam with a smaller spot size and with energy of over a few tens of kiloelectron volts. When the lens is applied to a 30 keV focused ion beam with 1 pA current, the spot size is estimated as 4.8 nm in diameter on a target with the above working distance.

 

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