Electrostatic accel–decel lens with the advantage of reduced chromatic aberration
作者:
Setsuo Nomura,
期刊:
Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena
(AIP Available online 1998)
卷期:
Volume 16,
issue 1
页码: 104-108
ISSN:1071-1023
年代: 1998
DOI:10.1116/1.589762
出版商: American Vacuum Society
数据来源: AIP
摘要:
An electrostatic lens, operated in accel–decel mode, is presented. The lens has advantage of low chromatic aberration, which is about2/3the amount produced by a conventional einzel lens operated in decel mode. The lens has two pieces of electrodes built in to accelerate and decelerate the beam. The decelerating electrode works as a main lens, while the accelerating electrode enhances the beam energy, reducing the aberration. Calculations for the accel–decel lens provideCcof 22 mm andfof 10 mm with working distance of 5 mm. The lens is suitable for producing a fine beam with a smaller spot size and with energy of over a few tens of kiloelectron volts. When the lens is applied to a 30 keV focused ion beam with 1 pA current, the spot size is estimated as 4.8 nm in diameter on a target with the above working distance.
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