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Thin film growth of semiconductingMg2Siby codeposition

 

作者: Andre´ Vantomme,   John E. Mahan,   Guido Langouche,   James P. Becker,   Margriet Van Bael,   Kristiaan Temst,   Chris Van Haesendonck,  

 

期刊: Applied Physics Letters  (AIP Available online 1997)
卷期: Volume 70, issue 9  

页码: 1086-1088

 

ISSN:0003-6951

 

年代: 1997

 

DOI:10.1063/1.118492

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Ultrahigh vacuum evaporation of magnesium onto a hot silicon substrate (⩾200 °C), with the intention of forming aMg2Sithin film by reaction, does not result in any accumulation of magnesium or its silicide. On the other hand,codeposition of magnesium with silicon at 200 °C, using a magnesium-rich flux ratio, gives a stoichiometricMg2Sifilm which can be grown several hundreds of nm thick. The number of magnesium atoms which condense is equal to twice the number ofsiliconatoms which were deposited; all the silicon condenses while the excess magnesium in the flux desorbs. TheMg2Silayers thus obtained are polycrystalline with a (111) texture. From the surface roughness analysis, a self-affine growth mode with a roughness exponent equal to 1 is deduced. ©1997 American Institute of Physics.

 

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