Thin film growth of semiconductingMg2Siby codeposition
作者:
Andre´ Vantomme,
John E. Mahan,
Guido Langouche,
James P. Becker,
Margriet Van Bael,
Kristiaan Temst,
Chris Van Haesendonck,
期刊:
Applied Physics Letters
(AIP Available online 1997)
卷期:
Volume 70,
issue 9
页码: 1086-1088
ISSN:0003-6951
年代: 1997
DOI:10.1063/1.118492
出版商: AIP
数据来源: AIP
摘要:
Ultrahigh vacuum evaporation of magnesium onto a hot silicon substrate (⩾200 °C), with the intention of forming aMg2Sithin film by reaction, does not result in any accumulation of magnesium or its silicide. On the other hand,codeposition of magnesium with silicon at 200 °C, using a magnesium-rich flux ratio, gives a stoichiometricMg2Sifilm which can be grown several hundreds of nm thick. The number of magnesium atoms which condense is equal to twice the number ofsiliconatoms which were deposited; all the silicon condenses while the excess magnesium in the flux desorbs. TheMg2Silayers thus obtained are polycrystalline with a (111) texture. From the surface roughness analysis, a self-affine growth mode with a roughness exponent equal to 1 is deduced. ©1997 American Institute of Physics.
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