Ferromagnetic resonance force microscopy on microscopic cobalt single layer films
作者:
Z. Zhang,
P. C. Hammel,
M. Midzor,
M. L. Roukes,
J. R. Childress,
期刊:
Applied Physics Letters
(AIP Available online 1998)
卷期:
Volume 73,
issue 14
页码: 2036-2038
ISSN:0003-6951
年代: 1998
DOI:10.1063/1.122359
出版商: AIP
数据来源: AIP
摘要:
We report mechanical detection of ferromagnetic resonance (FMR) signals from microscopic Co single layer thin films using a magnetic resonance force microscope (MRFM). Variations in the magnetic anisotropy field and the inhomogeneity of were clearly observed in the FMR spectra of microscopic Co thin films 500 and 1000 Å thick and∼40×200 &mgr;m2in lateral extent. This demonstrates the important potential that MRFM detection of FMR holds for microscopic characterization of spatial distribution of magnetic properties in magnetic layered materials and devices. ©1998 American Institute of Physics.
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