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Ferromagnetic resonance force microscopy on microscopic cobalt single layer films

 

作者: Z. Zhang,   P. C. Hammel,   M. Midzor,   M. L. Roukes,   J. R. Childress,  

 

期刊: Applied Physics Letters  (AIP Available online 1998)
卷期: Volume 73, issue 14  

页码: 2036-2038

 

ISSN:0003-6951

 

年代: 1998

 

DOI:10.1063/1.122359

 

出版商: AIP

 

数据来源: AIP

 

摘要:

We report mechanical detection of ferromagnetic resonance (FMR) signals from microscopic Co single layer thin films using a magnetic resonance force microscope (MRFM). Variations in the magnetic anisotropy field and the inhomogeneity of were clearly observed in the FMR spectra of microscopic Co thin films 500 and 1000 Å thick and∼40×200 &mgr;m2in lateral extent. This demonstrates the important potential that MRFM detection of FMR holds for microscopic characterization of spatial distribution of magnetic properties in magnetic layered materials and devices. ©1998 American Institute of Physics.

 

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