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Single quantum well photoluminescence in ZnSe/GaAs/AlGaAs grown by migration‐enhanced epitaxy

 

作者: Naoki Kobayashi,  

 

期刊: Applied Physics Letters  (AIP Available online 1989)
卷期: Volume 55, issue 12  

页码: 1235-1237

 

ISSN:0003-6951

 

年代: 1989

 

DOI:10.1063/1.101665

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Photoluminescence in ZnSe/GaAs/Al0.4Ga0.6As single quantum well heterostructures is reported for the first time. These structures are grown by migration‐enhanced epitaxy, resulting in flat and abrupt ZnSe/GaAs heterointerfaces. The quantum size effect is clearly observed. Photoluminescence intensities of ZnSe/GaAs/Al0.4Ga0.6As single quantum well structures are comparable to those of Al0.4Ga0.6As/GaAs/Al0.4Ga0.6As, indicating a reasonable quality of the ZnSe layer as well as the ZnSe/GaAs heterojunctions. From the GaAs well width dependence of photoluminescence wavelength, the conduction‐ and valence‐band‐edge discontinuities are estimated to be 0.03–0.05 eV and 1.21–1.23 eV, respectively.

 

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