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Nanometer‐scale modification and characterization of lead‐telluride surface by scanning tunneling microscope at 4.2 K

 

作者: D. N. Davydov,   Yu. B. Lyanda‐Geller,   S. A. Rykov,   H. Hancotte,   R. Deltour,   A. G. M. Jansen,   P. Wyder,  

 

期刊: Journal of Applied Physics  （AIP Available online 1996）
卷期: Volume 79, issue 5  

页码: 2435-2438

 

ISSN:0021-8979

 

年代: 1996

 

DOI:10.1063/1.361171

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Nanometer scale features on the semiconductor p‐PbTe single crystal surface were created and studied at 4.2 K by means of a scanning tunneling microscope. Local tunneling spectra were obtained simultaneously with the surface topographic image. The local tunneling density of states and the magnetotransport data reveal the amorphous state of the modified regions on the surface. ©1996 American Institute of Physics.

 

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