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Infrared excitation spectrum of 40.4‐meV acceptor level in neutron‐irradiated gallium‐doped silicon

 

作者: David W. Fischer,   W. C. Mitchel,  

 

期刊: Applied Physics Letters  (AIP Available online 1984)
卷期: Volume 45, issue 2  

页码: 167-168

 

ISSN:0003-6951

 

年代: 1984

 

DOI:10.1063/1.95156

 

出版商: AIP

 

数据来源: AIP

 

摘要:

An infrared absorption spectrum has been obtained for the shallowA2acceptor level formed by neutron irradiation of Si:Ga. After a 600 °C anneal, absorption peaks were observed at 213.1, 244.9, and 286.9 cm.−1These peaks appear to correspond to lines 1, 2, and 4 of a group III‐like acceptor spectrum originating from a ground state with a 40.4‐meV binding energy. Hall effect measurements confirm the presence of an acceptor level at this energy.

 

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