Infrared excitation spectrum of 40.4‐meV acceptor level in neutron‐irradiated gallium‐doped silicon
作者:
David W. Fischer,
W. C. Mitchel,
期刊:
Applied Physics Letters
(AIP Available online 1984)
卷期:
Volume 45,
issue 2
页码: 167-168
ISSN:0003-6951
年代: 1984
DOI:10.1063/1.95156
出版商: AIP
数据来源: AIP
摘要:
An infrared absorption spectrum has been obtained for the shallowA2acceptor level formed by neutron irradiation of Si:Ga. After a 600 °C anneal, absorption peaks were observed at 213.1, 244.9, and 286.9 cm.−1These peaks appear to correspond to lines 1, 2, and 4 of a group III‐like acceptor spectrum originating from a ground state with a 40.4‐meV binding energy. Hall effect measurements confirm the presence of an acceptor level at this energy.
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