A novel technique for scanning near‐field optical microscopy (SNOM) capable of point‐contact current‐sensing have been developed for investigation of nanometer‐scale optical and electrical properties of condensed matters. An apertureless bent‐metal probe was fabricated in order to detect optical and current signals at a local point on the sample surface. The near‐field optical properties could be observed using the local field enhancement effect generated at the edge of the metal probe under p‐polarized laser illumination. With regard to electrical properties, current signal could be detected with the metal probe connected to a high‐sensitive current amplifier. Nanometer‐scale optical and electronic properties of electrochromic (EC) films were investigated using the current‐sensing SNOM. Furthermore, nanometer‐scale EC modification of individual grains bleaching could be successfully performed. The current‐sensing SNOM has potential use in various fields of nanometer‐scale optoelectronics. © 2003 American Institute of Physics