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Negative ion beams from compact surface plasma sources and their merits for new applications

 

作者: S. K. Guharay,  

 

期刊: AIP Conference Proceedings  (AIP Available online 1998)
卷期: Volume 439, issue 1  

页码: 158-164

 

ISSN:0094-243X

 

年代: 1998

 

DOI:10.1063/1.56366

 

出版商: AIP

 

数据来源: AIP

 

摘要:

In recent times, special merits of negative ion beams have been recognized in the context of novel materials science applications, and there is a plenty of room for further growth of the field. Various kinds of negative ion sources are currently available. Compact surface-plasma type sources, namely, Penning, planotron and semi-planotron sources, are discussed with special emphasis on the merits of these sources for applications in the area of microlithography, ion microscopy, and surface modifications. The potential of these sources for high-current applications, such as spallation neutron source, is also discussed. ©1998 American Institute of Physics.

 

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