Epitaxial growth of cubic AlN films on (100) and (111) silicon by pulsed laser ablation
作者:
Wen‐Tai Lin,
Ling‐Cheng Meng,
Guo‐Ju Chen,
Hok‐Shin Liu,
期刊:
Applied Physics Letters
(AIP Available online 1995)
卷期:
Volume 66,
issue 16
页码: 2066-2068
ISSN:0003-6951
年代: 1995
DOI:10.1063/1.113904
出版商: AIP
数据来源: AIP
摘要:
Epitaxial growth of cubic AlN thin films on (100) and (111) silicon substrates by pulsed laser ablation is reported. The epitaxial AlN films can be grown at temperatures above 630 °C in 100–300 mTorr of N2. The epitaxial orientation relationships are (100)AlN//(100)Si and [010]AlN//[010]Si, and (111)AlN//(111)Si and [011¯]AlN//[011¯]Si. The growth of microtwins on (111) planes of AlN was also observed. In the present study, for the AlN thin films grown on (100)Si at around 680 °C in 100 mTorr of N2, the epitaxial growth can cover about 90% of the film region. ©1995 American Institute of Physics.
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