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Epitaxial growth of cubic AlN films on (100) and (111) silicon by pulsed laser ablation

 

作者: Wen‐Tai Lin,   Ling‐Cheng Meng,   Guo‐Ju Chen,   Hok‐Shin Liu,  

 

期刊: Applied Physics Letters  (AIP Available online 1995)
卷期: Volume 66, issue 16  

页码: 2066-2068

 

ISSN:0003-6951

 

年代: 1995

 

DOI:10.1063/1.113904

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Epitaxial growth of cubic AlN thin films on (100) and (111) silicon substrates by pulsed laser ablation is reported. The epitaxial AlN films can be grown at temperatures above 630 °C in 100–300 mTorr of N2. The epitaxial orientation relationships are (100)AlN//(100)Si and [010]AlN//[010]Si, and (111)AlN//(111)Si and [011¯]AlN//[011¯]Si. The growth of microtwins on (111) planes of AlN was also observed. In the present study, for the AlN thin films grown on (100)Si at around 680 °C in 100 mTorr of N2, the epitaxial growth can cover about 90% of the film region. ©1995 American Institute of Physics.

 

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