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Angular atomic emission distribution of nickel bombarded by 23 keV Ar ions above and below the curie temperature

 

作者: D. Rübesame,   H. Niedrig,  

 

期刊: Radiation Effects and Defects in Solids  (Taylor Available online 1996)
卷期: Volume 138, issue 1-2  

页码: 49-56

 

ISSN:1042-0150

 

年代: 1996

 

DOI:10.1080/10420159608211508

 

出版商: Taylor & Francis Group

 

关键词: sputtering;atomic emission distribution;Curie temperature;spot emission

 

数据来源: Taylor

 

摘要:

The emission of atoms induced by ion bombardment of a crystalline nickel target was investigated using the collector method: the sputtered atoms condense on the surface of a hemispherical collector placed above the target, and the thickness distribution of the condensed matter, which is a measure of the angular emission distribution, is determined with a modified scanning electron microscope by measuring the backscattered electron ratio with high spatial resolution.

 

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