Angular atomic emission distribution of nickel bombarded by 23 keV Ar ions above and below the curie temperature
作者:
D. Rübesame,
H. Niedrig,
期刊:
Radiation Effects and Defects in Solids
(Taylor Available online 1996)
卷期:
Volume 138,
issue 1-2
页码: 49-56
ISSN:1042-0150
年代: 1996
DOI:10.1080/10420159608211508
出版商: Taylor & Francis Group
关键词: sputtering;atomic emission distribution;Curie temperature;spot emission
数据来源: Taylor
摘要:
The emission of atoms induced by ion bombardment of a crystalline nickel target was investigated using the collector method: the sputtered atoms condense on the surface of a hemispherical collector placed above the target, and the thickness distribution of the condensed matter, which is a measure of the angular emission distribution, is determined with a modified scanning electron microscope by measuring the backscattered electron ratio with high spatial resolution.
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