A curve fitting algorithm applied to optical diffraction data
作者:
D. B. Clegg,
C. A. Hobson,
M. J. Lalor,
D. J. Moreland,
期刊:
International Journal of Mathematical Education in Science and Technology
(Taylor Available online 1989)
卷期:
Volume 20,
issue 4
页码: 491-500
ISSN:0020-739X
年代: 1989
DOI:10.1080/0020739890200401
出版商: Taylor & Francis Group
数据来源: Taylor
摘要:
Real‐time non‐contact high‐accuracy measurements of small components are realized by utilizing diffraction pattern theory. High‐speed line scan CCD (charge‐coupled device) sensors, coupled with a microcomputer system with specialized hardware allow the implementation of a polynomial least squares curve fitting algorithm for the analysis of diffraction pattern data. Simulation has been used to determine accuracy requirements of the system when used in a practical situation.
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