Thickness effect on hydrogen plasma treatment on polycrystalline silicon thin films
作者:
Bor Wen Liou,
Yi Huang Wu,
Chung Len Lee,
Tan Fu Lei,
期刊:
Applied Physics Letters
(AIP Available online 1995)
卷期:
Volume 66,
issue 22
页码: 3013-3014
ISSN:0003-6951
年代: 1995
DOI:10.1063/1.114261
出版商: AIP
数据来源: AIP
摘要:
This letter studies the hydrogen plasma effects on the resistivity, effective free carrier concentration, and mobility of As+‐ and BF+2‐doped polycrystalline silicon (polysilicon) thin films of various thicknesses. It is found that the resistivity increases while the effective free carrier concentration decreases after the plasma treatment as the thickness of the polysilicon film decreases. The mobility typically tends to decrease for the thicker (≳60 nm) polysilicon film, but to increase for the thinner (<60 nm) polysilicon film. ©1995 American Institute of Physics.
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