Atomic force measurement of low-frequency dielectric noise
作者:
L. E. Walther,
E. Vidal Russell,
N. E. Israeloff,
H. Alvarez Gomariz,
期刊:
Applied Physics Letters
(AIP Available online 1998)
卷期:
Volume 72,
issue 24
页码: 3223-3225
ISSN:0003-6951
年代: 1998
DOI:10.1063/1.121556
出版商: AIP
数据来源: AIP
摘要:
Using noncontact scanning probe microscopy techniques, dielectric properties were studied on 50-nm-length scales in poly-vinyl-acetate (PVAc) and poly-methyl-methacrylate films. Low-frequency(1/f )fluctuations observed in the measurements, peaked in intensity near the glass transition temperature in PVAc. The noise is shown to arise from thermal dielectric polarization fluctuations. Analysis of this noise provides a noninvasive method of probing equilibrium nanometer-scale dynamical processes in dielectric materials and devices. ©1998 American Institute of Physics.
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