A method for the accurate measurement of lattice compressions of low‐Z materials at pressures up to 12 GPa by x‐ray diffraction
作者:
P. M. Halleck,
Bart Olinger,
期刊:
Review of Scientific Instruments
(AIP Available online 1974)
卷期:
Volume 45,
issue 11
页码: 1408-1410
ISSN:0034-6748
年代: 1974
DOI:10.1063/1.1686514
出版商: AIP
数据来源: AIP
摘要:
The technique developed by Jamieson and Lawson for x‐ray diffraction at high pressure has been modified so that low‐Z materials can be studied under high pressure conditions to 12 GPa. A beryllium annulus replaces the commonly used boron annulus, allowing the use of Cu K&agr;or Fe K&agr;radiation, thus improving the accuracy ofd‐space determinations. The inclusion of a 4:1 methanol‐chanol mixture developed by Piermarini,et al.relieves pressure gradients and anisotropy, improving both the quality and range of compression data. Excellent compression results are obtained in the 0–1 GPa region where x‐ray techniques have formerly been inaccurate.
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