Characterization of reactive ion etched AlGaAs/GaAs heterostructures by photoluminescence and low temperature Hall measurements
作者:
M. Joseph,
F. E. G. Guimaraes,
J. Kraus,
F.‐J. Tegude,
期刊:
Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena
(AIP Available online 1991)
卷期:
Volume 9,
issue 3
页码: 1456-1460
ISSN:1071-1023
年代: 1991
DOI:10.1116/1.585450
出版商: American Vacuum Society
关键词: ALUMINIUM ARSENIDES;GALLIUM;HETEROSTRUCTURES;ETCHING;ION BEAMS;PHOTOLUMINESCENCE;HALL EFFECT;QUANTUM WELL STRUCTURES;VPE;MOLECULAR BEAM EPITAXY;(AlGa)As;GaAs
数据来源: AIP
摘要:
A low damage dry etch process has been developed for the gate recess of AlGaAs/GaAs heterostructure field effect transistor (HFET) with a selectivity of the etch rates greater than 750:1. The reactive ion etching induced damage has been compared to that reported from other etch processes in literature by the means of photoluminescence (PL) emission from multiple quantum well structures. Better resolution in amount and depth of created defects is obtained by PL measurements of undoped heterostructure layers. The temperature dependent Hall mobility μHand sheet carrier concentrationnsof a doped heterostructure layer which directly correspond to the HFET device properties are evaluated in the dark and under illumination. Values of 360.000 cm2/V s for μHand 8.6×1011cm−2fornsat 15 K after the etch process show that a residual damage can be neglected.
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