Surface microanalysis by reflection electron energy‐loss spectroscopy
作者:
Z. L. Wang,
期刊:
Journal of Electron Microscopy Technique
(WILEY Available online 1990)
卷期:
Volume 14,
issue 1
页码: 13-20
ISSN:0741-0581
年代: 1990
DOI:10.1002/jemt.1060140104
出版商: Wiley Subscription Services, Inc., A Wiley Company
关键词: ω correction;Lorentzian angular distribution
数据来源: WILEY
摘要:
AbstractSeveral basic physical concepts of applying eq. Ik= IσNxt to surface microanalysis by reflection electron energy‐loss spectroscopy (REELS) are clarified. Here Ikand I are the integrated intensities of the core ionization edge and the low loss part, σ is the scattering cross section of element x with atomic concentration Nx, and t is the specimen thickness. The reflected inelastic electrons are found to be distributed almost symmetrically around the Bragg sports and can be reasonably described by a Lorentzian function. EELS microanalysis can be performed by using the diffracted sports. The ω correction, arising from the angular contributions of the neighbouring spots into the spectrometer collecting aperture, is required to be consid
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