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Extraordinary growth ofC60on a GaAs(001) As-rich2×4surface

 

作者: T. Sakurai,   Qikun Xue,   T. Hashizume,   Y. Hasegawa,  

 

期刊: Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena  (AIP Available online 1997)
卷期: Volume 15, issue 5  

页码: 1628-1632

 

ISSN:1071-1023

 

年代: 1997

 

DOI:10.1116/1.589561

 

出版商: American Vacuum Society

 

关键词: GaAs;C60

 

数据来源: AIP

 

摘要:

We have systematically investigated, by using scanning tunneling microscopy, the adsorption and film growth ofC60on the various GaAs(001) surface phases prepared by molecular-beam epitaxy. For most phases, theC60overlayer exhibits the usual close-packed fcc(111) configuration with its lattice constant close to that of the bulkC60crystal. However, in the case ofC60on the As-rich2×4substrate, the epitaxial growth is found to be quite different and unique;C60film takes its (110) crystalline axis; theC60overlayer is highly strained with a lattice expansion of∼13%,and this structure is very stable at least up to 10 ML. We will address the underlying formation mechanism of this new structure in terms of a charge transfer from the As-dangling bonds toC60sand a site-specificC60-substrate interaction, as confirmed by molecular dynamic simulations. The present system provides a unique opportunity to study fullerene and/or noble-gas related two-dimensional phenomena, and demonstrates a potential for fabrication of novel fullerene-based devices, such as strained superlattice structures.

 

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