首页   按字顺浏览 期刊浏览 卷期浏览 Tests of a position sensitive photomultiplier and measurement of diffraction pattern by...
Tests of a position sensitive photomultiplier and measurement of diffraction pattern by counting single photons

 

作者: S. Korpar,   P. Krizˇan,   A. Gorisˇek,   A. Stanovnik,  

 

期刊: AIP Conference Proceedings  (AIP Available online 1900)
卷期: Volume 536, issue 1  

页码: 340-348

 

ISSN:0094-243X

 

年代: 1900

 

DOI:10.1063/1.1361772

 

出版商: AIP

 

数据来源: AIP

 

摘要:

The present paper describes a laboratory course held at the ICFA’99 Instrumentation School in Istanbul, Turkey. This course intends to introduce position sensitive multianode photomultiplier tubes (Hamamatsu R5900 type M16 and L16). Using a light emitting diode, the student will measure position sensitivity by scanning the light spot across the M16 PMT. The second part of the exercise consists of measuring a diffraction pattern produced by light passing through a slit. For this purpose the L16 PMT is used and the students attention is drawn to the pedagogical problem of wave-particle duality. ©2000 American Institute of Physics.

 

点击下载:  PDF (517KB)



返 回