Tests of a position sensitive photomultiplier and measurement of diffraction pattern by counting single photons
作者:
S. Korpar,
P. Krizˇan,
A. Gorisˇek,
A. Stanovnik,
期刊:
AIP Conference Proceedings
(AIP Available online 1900)
卷期:
Volume 536,
issue 1
页码: 340-348
ISSN:0094-243X
年代: 1900
DOI:10.1063/1.1361772
出版商: AIP
数据来源: AIP
摘要:
The present paper describes a laboratory course held at the ICFA’99 Instrumentation School in Istanbul, Turkey. This course intends to introduce position sensitive multianode photomultiplier tubes (Hamamatsu R5900 type M16 and L16). Using a light emitting diode, the student will measure position sensitivity by scanning the light spot across the M16 PMT. The second part of the exercise consists of measuring a diffraction pattern produced by light passing through a slit. For this purpose the L16 PMT is used and the students attention is drawn to the pedagogical problem of wave-particle duality. ©2000 American Institute of Physics.
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