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Measurement of elastic impedance with high spatial resolution using acoustic microscopy

 

作者: S. Hirsekorn,   S. Pangraz,   G. Weides,   W. Arnold,  

 

期刊: Applied Physics Letters  (AIP Available online 1995)
卷期: Volume 67, issue 6  

页码: 745-747

 

ISSN:0003-6951

 

年代: 1995

 

DOI:10.1063/1.115212

 

出版商: AIP

 

数据来源: AIP

 

摘要:

The magnitude of the gray levels in an image obtained by an acoustric microscope can be exploited to measure the acoustic impedance of a sample with the spatial resolution of the instrument. Theoretical considerations show the functional dependence of the maximal amplitude of specular reflection from material constants, which is confirmed by experiments. It turns out that for these amplitude values the opening angle of the lens plays a minor role. For a quantitative evaluation of the impedance, calibration by a known object material is necessary. ©1995 American Institute of Physics.

 

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