Band‐to‐band Auger recombination in silicon based on a tunneling technique. II. Experiment
作者:
G. Krieger,
R. M. Swanson,
期刊:
Journal of Applied Physics
(AIP Available online 1983)
卷期:
Volume 54,
issue 6
页码: 3456-3463
ISSN:0021-8979
年代: 1983
DOI:10.1063/1.332409
出版商: AIP
数据来源: AIP
摘要:
Using a new method based on hot‐electron generation, band‐to‐band Auger recombination inn+silicon is studied experimentally. Using the theory developed in Part I, a conservative analysis demonstrates that this Auger recombination is limited to an electron Auger coefficient smaller than 5×10−32cm6/sec which is in disagreement with some earlier studies reportingCn=2.8×10−31cm6/sec.
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