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Band‐to‐band Auger recombination in silicon based on a tunneling technique. II. Experiment

 

作者: G. Krieger,   R. M. Swanson,  

 

期刊: Journal of Applied Physics  (AIP Available online 1983)
卷期: Volume 54, issue 6  

页码: 3456-3463

 

ISSN:0021-8979

 

年代: 1983

 

DOI:10.1063/1.332409

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Using a new method based on hot‐electron generation, band‐to‐band Auger recombination inn+silicon is studied experimentally. Using the theory developed in Part I, a conservative analysis demonstrates that this Auger recombination is limited to an electron Auger coefficient smaller than 5×10−32cm6/sec which is in disagreement with some earlier studies reportingCn=2.8×10−31cm6/sec.

 

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