Electromigration of aluminum cathodes in polymer‐based electroluminescent devices
作者:
B. H. Cumpston,
K. F. Jensen,
期刊:
Applied Physics Letters
(AIP Available online 1996)
卷期:
Volume 69,
issue 25
页码: 3941-3943
ISSN:0003-6951
年代: 1996
DOI:10.1063/1.117577
出版商: AIP
数据来源: AIP
摘要:
Dark, nonemissive defects form on the metal cathode in most molecular organic and polymer‐based light emitting devices and eventually lead to the failure of the device. These defects have been characterizedinsituusing optical microscopy andexsituusing atomic force microscopy and Auger electron spectroscopy. On the basis of these observations, an electromigration mechanism for the formation of dark spot defects is proposed. The high current density required to operate polymer‐based light emitting devices leads to electron‐induced diffusion of the Al cathode when a short circuit forms in the emissive polymer layer. This process results in a ‘‘pileup’’ of metal at the short circuit (anode) and a surrounding circular region where the Al is depleted, appearing as a dark spot on the cathode. ©1996 American Institute of Physics.
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