An x‐ray macroprobe attachment for the focusing CGR Cristallobloc 31 x‐ray spectrometer has been developed. Selected‐area analysis in the range 0.01–1 mm2has been achieved using electron excitation. Focusing devices giving rectangular spot sizes of 1×1 mm and 2×0.15 mm have been used, and devices for sizes 0.2×0.2 mm and 0.1×0.1 mm should be feasible. All elements down to atomic number 5 (boron) can in principle be analyzed by this inexpensive device. Limits of detection of several elements in different matrices are reported. Applications to several metallurgical problems showing the versatility of the macroprobe are reported (examination of a welded joint and detection of silicon and niobium inclusions).