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Excitons and impurity centers in thin wires and in porous silicon

 

作者: A. Shik,  

 

期刊: Journal of Applied Physics  (AIP Available online 1993)
卷期: Volume 74, issue 4  

页码: 2951-2953

 

ISSN:0021-8979

 

年代: 1993

 

DOI:10.1063/1.354601

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Theoretical treatment is given to the problem of a Coulomb center in thin wire with the dielectric constant æ≫1. The model describes adequately impurity centers and excitions in porous Si. The shape of Coulomb potential &fgr;(r) inside the wire disturbed drastically by image forces is analyzed. The exciton (or impurity) binding energy determined by the Schro¨dinger equation with &fgr;(r) demonstrates a manifold increase with the decrease of the wire radius.

 

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