A periodically domain‐inverted KTiOPO4crystal has been characterized for the first time by multiple‐crystal multiple‐reflection x‐ray topography. The striation contrast within the domain‐ inverted regions has been revealed in high strain‐sensitivity reflection topographs. The origin of formation of the striation contrast and the mechanism of domain inversion in KTiOPO4are discussed in terms of the structural characteristics of KTiOPO4. ©1995 American Institute of Physics.