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Four‐Probe Device for Accurate Measurement of Temperature Dependence of Electrical Resistivity on Small, Irregularly Shaped Single Crystals With Parallel Sides

 

作者: R. W. Germann,   D. B. Rogers,  

 

期刊: Review of Scientific Instruments  (AIP Available online 1966)
卷期: Volume 37, issue 3  

页码: 273-274

 

ISSN:0034-6748

 

年代: 1966

 

DOI:10.1063/1.1720156

 

出版商: AIP

 

数据来源: AIP

 

摘要:

A sample holder is described that considerably facilitates the measurement of specific resistivity on small, irregularly shaped single crystals over a large range of temperature. Utilizing the van der Pauw technique, accurate values of this electrical transport parameter have been obtained without loss of contact at temperatures as low as 4.2°K. The essential advantage of this holder is its simplicity which eliminates the necessity of specialized techniques for accurate measurements on irregular crystals as small as 1 mm.

 

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