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High quality interfaces in GaAs–AlAs quantum wells determined from high resolution photoluminescence

 

作者: D. C. Reynolds,   D. C. Look,   B. Jogai,   R. Kaspi,   K. R. Evans,   M. Estes,  

 

期刊: Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena  (AIP Available online 1997)
卷期: Volume 15, issue 5  

页码: 1703-1706

 

ISSN:1071-1023

 

年代: 1997

 

DOI:10.1116/1.589358

 

出版商: American Vacuum Society

 

关键词: (Al,Ga)As

 

数据来源: AIP

 

摘要:

High resolution photoluminescence (PL) measurements performed on several GaAs–AlAs quantum well structures revealed sharp excitonic transitions separated in energies corresponding to roughly half-monolayer fluctuations in well size. The narrow linewidths correlate with interface island structure whose lateral extent is either much larger or much smaller than the exciton diameter. The half-monolayer separation results from a sharply peaked PL intensity response occurring around those areas of the laterally nonuniform interface which have roughly 50% island coverage, with the average island size much smaller than the exciton diameter, about 225 Å.

 

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