Low temperature magnetic force microscopy
作者:
H. J. Hug,
A. Moser,
Th. Jung,
O. Fritz,
A. Wadas,
I. Parashikov,
H.‐J. Gu¨ntherodt,
期刊:
Review of Scientific Instruments
(AIP Available online 1993)
卷期:
Volume 64,
issue 10
页码: 2920-2925
ISSN:0034-6748
年代: 1993
DOI:10.1063/1.1144383
出版商: AIP
数据来源: AIP
摘要:
We have built a low temperature scanning force microscope which is able to measure contact and noncontact forces using the dc modes of force microscopy. We demonstrate the capabilities of our instrument on a magneto‐optical disk at room temperature and at 77 K. Using a ferromagnetic thin film tip, the topography and the micromagnetic stray field of the sample is measured using the dc modes of force microscopy. The topographic and magnetic data are precisely correlated. The circular bit structure and the natural domain structure between the homogeneously magnetized bits is clearly visible. A lateral resolution below 100 nm and a force resolution of 10−12N is reproducibly achieved.
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