Thermally stimulated discharge (TSD) behavior of native (dark rested) and irradiated amorphous selenium films (∼100 &mgr;m) has been studied. The TSD spectrum of nonirradiated films shows electron trapping levels at ∼0.99 eV and no detectable hole trapping levels. On the other hand, the irradiated films show both electron as well as hole trapping levels at 0.99 and 1.05 eV, respectively. These results have been explained in terms of trapping of charge carriers at intrinsic defect states and the photoinduced defect levels created during irradiation.