Tilt moire´ patterns

 

作者: J. R. White,  

 

期刊: Journal of Applied Physics  (AIP Available online 1974)
卷期: Volume 45, issue 2  

页码: 588-592

 

ISSN:0021-8979

 

年代: 1974

 

DOI:10.1063/1.1663288

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Consideration is given to the image formed in the electron microscope of two crystals stacked one above the other when these show a relative rotation about an axis perpendicular to the electron beam. Dark‐field moire´ fringe patterns are predicted when certain conditions relating to the relative proximity to the Bragg condition of the two crystals are fulfilled. The limits of these conditions and the spacings of the fringes are formulated in terms of the angle of tilt and the direction of the tilt axis.

 

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